Material:metals, semiconductors, silicon, GaAs, plastics, cerami
Application:3D-measurement, surface topography, surface-roughness
Brand:Sentronics Metrology

StraDex a for Measurement of Roughness/ 3D Micro-Topography

The StraDex a sensor permits optical, and hence non-contact, ultra-high precision measurement of the roughnesses of objects. Both 1D and 2D roughnesses are determined.

The data are recorded in the form of a line or an area. Many clients use the compact sensor in production for continuous measurement of every part on a conveyor belt.

Thanks to the flexible data standard, the results can be evaluated both with the user-friendly TopoSpect system software and with third-party software.


  • D Micro-Topography

  • 1D Roughnesses in the sub-nm range

  • 2D Roughnesses (load factor)


  • Roughness measurement in the sub-nm range

  • Acquisition times: up to 4 s; 1 s (reduced size)

  • Working distance 3.5 mm

  • Max. autofocus range: 150 µm

  • Area measured: 400 × 400 µm²

  • User-friendly TopoSpect or TopoLine software

  • Optional: Integratable into external automation system or CMM

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Product group: Process Control
Application:Layer thickness & roughness
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