|Material:||metals, semiconductors, silicon, GaAs, plastics, cerami|
|Application:||3D-measurement, surface topography, surface-roughness|
StraDex a for Measurement of Roughness/ 3D Micro-Topography
The StraDex a sensor permits optical, and hence non-contact, ultra-high precision measurement of the roughnesses of objects. Both 1D and 2D roughnesses are determined.
The data are recorded in the form of a line or an area. Many clients use the compact sensor in production for continuous measurement of every part on a conveyor belt.
Thanks to the flexible data standard, the results can be evaluated both with the user-friendly TopoSpect system software and with third-party software.
Roughness measurement in the sub-nm range
Acquisition times: up to 4 s; 1 s (reduced size)
Working distance 3.5 mm
Max. autofocus range: 150 µm
Area measured: 400 × 400 µm²
User-friendly TopoSpect or TopoLine software
Optional: Integratable into external automation system or CMM
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