Surface Analysis
Optical, roughness, 3D topography, desktop
Optical surface analysis system for quick, non-contact topographies and highly complex geometries. OPTOTOP
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Optical surface analysis system for quick, non-contact topographies and highly complex geometries. OPTOTOPDetails »
Roughness, 3D topography, optical, portable
Portable system for non-contact and first-rate quality measurements and analyses of surface profiles. TRACEiT®
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Portable system for non-contact and first-rate quality measurements and analyses of surface profiles. TRACEiT®Details »
SemDex 301
Semi-automatic Wafer-inspection System with Integrated Optical Metrology for a Wide Range of Applications
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Semi-automatic Wafer-inspection System with Integrated Optical Metrology for a Wide Range of ApplicationsDetails »
Surface Tester, Universal
Analysis with sub-micrometer accuracy of micro-mechanic, micro-tribologic and functional properties of materials.
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Analysis with sub-micrometer accuracy of micro-mechanic, micro-tribologic and functional properties of materials.Details »
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