Innowep Optical, roughness, 3D topography, desktop

Material:all materials
Application:topography, profile, structure, roughness
Brochure:Download pdf

Profilometer, 3D, non-contact.

Optical surface measurement system for quick non-contact measurement of topography and complex geometric models in the nano-, micro-and macro-range. Compact stand-alone laboratory instrument, including PC.

Used in; research and development, acceptance testing, quality control and failure analysis.

  • Easy to handle and user-friendly

  • Fast data acquisition

  • Robust measurement method robust for various materials, coatings and samples

  • Micro roughness index for linear profile

  • Topography profile 2-D linear, 3-D display and profile height up to 2 mm Z

  • 12 nm Resolution


  • Analysis of roughness and structure determination on flat or curved samples, structured or smooth.

  • Measurements of macro and micro geometry and flatness control.

  • Surface control, e.g. embossing (option: mobile unit)

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Product group:Surface Analysis
Application:Surface Analysis
Product:Innowep Optical, roughness, 3D topography, desktop
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Innowep Optical, roughness, 3D topography, desktop 

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