Optical surface measurement system for quick non-contact measurement of topography and complex geometric models in the nano-, micro-and macro-range. Compact stand-alone laboratory instrument, including PC.
Used in; research and development, acceptance testing, quality control and failure analysis.
Easy to handle and user-friendly
Fast data acquisition
Robust measurement method robust for various materials, coatings and samples
Micro roughness index for linear profile
Topography profile 2-D linear, 3-D display and profile height up to 2 mm Z
12 nm Resolution
Analysis of roughness and structure determination on flat or curved samples, structured or smooth.
Measurements of macro and micro geometry and flatness control.
Surface control, e.g. embossing (option: mobile unit)